author
Lewis M. (Lewis Madison) Terman
1877–1956
Best known for adapting the Binet test into the Stanford-Binet, he helped shape how intelligence was measured in the United States. His long-running study of gifted children made him one of the most influential—and debated—figures in early educational psychology.
3 Audiobooks
The measurement of intelligence : an explanation of and a complete guide for the use of the Standard revision and extension of the Binet-Simon intelligence scale
by Lewis M. (Lewis Madison) Terman
Condensed guide for the Stanford revision of the Binet-Simon intelligence tests
by Lewis M. (Lewis Madison) Terman
Stanford Achievement Test, Ed. 1922 : Advanced Examination, Form A, for Grades 4-8
by Truman Lee Kelley, G. M. (Giles Murrel) Ruch, Lewis M. (Lewis Madison) Terman
About the author
Born in Indiana in 1877, Lewis Madison Terman became an American psychologist and educator whose work had a lasting effect on schools and testing. After earning his doctorate at Clark University, he joined Stanford University in 1910 and built his career there as a leading figure in educational psychology.
Terman is most widely remembered for revising the Binet intelligence test into the Stanford-Binet, first published in 1916, which became one of the best-known intelligence tests in the United States. He also launched a major long-term study of gifted children in 1921, later published in the Genetic Studies of Genius volumes, which followed participants across much of their lives.
His legacy is important but also complicated. Alongside his influence on intelligence testing and the study of giftedness, modern accounts note his support for eugenic ideas, which has made his work a subject of continuing criticism as well as historical interest. He died in Palo Alto, California, in 1956.